发明名称 ON-CHIP POLARIMETRY FOR HIGH-THROUGHPUT SCREENING OF NANOLITER AND SMALLER SAMPLE VOLUMES
摘要 A polarimetry technique for measuring optical activity that is particularly suited for high throughput screening employs a chip or substrate (22) having one or more microfluidic channels (26) formed therein. A polarized laser beam (14) is directed onto optically active samples that are disposed in the channels. The incident laser beam interacts with the optically active molecules in the sample, which slightly alter the polarization of the laser beam as it passes multiple times through the sample. Interference fringe patterns (28) are generated by the interaction of the laser beam with the sample and the channel walls. A photodetector (34) is positioned to receive the interference fringe patterns and generate an output signal that is input to a computer or other analyzer (38) for analyzing the signal and determining the rotation of plane polarized light by optically active material in the channel from polarization rotation calculations.
申请公布号 EP1805498(A2) 申请公布日期 2007.07.11
申请号 EP20050821243 申请日期 2005.10.24
申请人 VANDERBILT UNIVERSITY 发明人 BORNHOP, DARRYL, J.;DOTSON, STEPHEN;O BACHMANN, BRIAN
分类号 G01N15/06;B01L9/00;B32B5/02;G01B9/02;G01J4/04;G01N21/21;G01N21/45 主分类号 G01N15/06
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