发明名称 Semiconductor memory device and method for producing the same
摘要 <p>A semiconductor device comprises a floating gate which is formed on a semiconductor substrate of a first conductive type interposing a first gate insulation layer therebetween, a second charge retaining area which is formed on the semiconductor substrate interposing a second insulation layer, a control gate which is formed on the floating gate interposing a second gate insulation layer therebetween, a second gate electrode which extends in the first direction and which is formed on the second charge retaining region interposing the second gate insulation layer therebetween, and a semiconductor layer which extends in a second direction and which is formed on the semiconductor substrate so as to intersect the first and the second gate electrode are provided; wherein an n-type conductive region of a second conductive type is formed on the semiconductor layer. Consequently, it achieves high-integration of a semiconductor device.</p>
申请公布号 EP1806788(A2) 申请公布日期 2007.07.11
申请号 EP20060026218 申请日期 2006.12.18
申请人 RENESAS TECHNOLOGY CORP. 发明人 ISHIGAKI, TAKASHI;OSABE, TARO;KOBAYASHI, TAKASHI;IMAI, YUTAKA;SHIMIZU, MASAHIRO
分类号 H01L29/788;H01L21/336;H01L27/115 主分类号 H01L29/788
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