| 摘要 |
There is provided a burn-in monitor for testing modules on an Integrated Circuit (IC), and a corresponding method. The burn-in monitor comprises: a Serial Test and Configuration Interface STCI for controlling and observing modules through a scan chain; a scan-in pin for loading a prepared set of test vectors; and a scan-out pin associated with the STCI for outputting all status bits. A burn-in mode is provided on the STCI and is selectable during testing for configuring the scan chain, such that said scan chain contains only those status bits required for monitoring burn-in, plus a number of bits necessary for controlling overall behaviour of the scan chain whereby the scan elements associated with the control bits will be loaded with zero. Hence the scan-out pin will show a one if there is a fault. Preferably the scan chain contains the minimum number of control bits necessary for controlling overall behaviour of the scan chain.
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