发明名称 Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
摘要 In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.
申请公布号 US7241987(B2) 申请公布日期 2007.07.10
申请号 US20050196104 申请日期 2005.08.03
申请人 SII NANOTECHNOLOGY INC. 发明人 SAITO YUIKA;MURAKAMI TAKASHI;KAWATA SATOSHI;INOUE YASUSHI;TSUKAGOSHI KAZUHITO;IYOKI MASATO
分类号 H01J3/14;G01N21/27;G01N21/65;G01N23/00;G01Q60/22;G21K7/00;H01J5/16;H01J40/14 主分类号 H01J3/14
代理机构 代理人
主权项
地址