A semiconductor device pattern for a test is provided to monitor stably AC(Alternating Current) characteristics in a semiconductor device fabrication by counting the clock signals oscillated from a ring oscillator using a counter. A semiconductor device pattern for a test includes a plurality of ring oscillators and a counter. The ring oscillators(110) are used for generating a test clock signal. The counter(120) is used for receiving the test clock signal generated from the ring oscillator and counting the number of test clock signals. The semiconductor device pattern for the test is formed within a scribe region of a semiconductor wafer. The semiconductor device pattern for the test further includes a decoder for selecting one out of the plurality of ring oscillators.
