发明名称 Smart verify for multi-state memories
摘要 A "smart verify" technique, whereby multi-state memories are programmed using a verify-results-based dynamic adjustment of the multi-states verify range for sequential-state-based verify implementations, is presented. This technique can increase multi-state write speed while maintaining reliable operation within sequentially verified, multi-state memory implementations by providing "intelligent" element to minimize the number of sequential verify operations for each program/verify/lockout step of the write sequence. At the beginning of a program/verify cycle sequence only the lowest state or states are checked during the verify phase. As lower states are reached, additional higher states are added to the verify sequence and lower states can be removed.
申请公布号 US7243275(B2) 申请公布日期 2007.07.10
申请号 US20050304961 申请日期 2005.12.14
申请人 SANDISK CORPORATION 发明人 GONGWER GEOFFREY S.;GUTERMAN DANIEL C.;FONG YUPIN KAWING
分类号 G11C29/00;G11C7/00;G11C11/56;G11C16/34 主分类号 G11C29/00
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