发明名称 Reduced capacitance resistors
摘要 A method for reducing the parasitic capacitance in resistors, and a resistor design embodying this method are described. By creating a p-type or an n-type implant inside of an n-well or a p-substrate, respectively, where the n-well or p-substrate is located in a p-substrate or n-substrate, respectively, a capacitively coupled capacitor is formed in series connection with the parasitic inter-layer dielectric capacitance generated when the resistor is fabricated in the dielectric material. The depletion region formed thereby behaves as a series capacitor which reduces the overall capacitance of the assemblage. The n-well or p-substrate can be placed in electrical connection with a ground potential or brought to a chosen voltage to further increase the depletion region and reduce the capacitance of the resistor.
申请公布号 US7242074(B2) 申请公布日期 2007.07.10
申请号 US20040005765 申请日期 2004.12.06
申请人 LSI CORPORATION 发明人 ERICKSON SEAN C.;SHAW JONATHAN;NUNN KEVIN R.
分类号 H01L29/00 主分类号 H01L29/00
代理机构 代理人
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