Integrated test processor (ITP) for a system on chip (SOC) that includes a network on chip (NOC)

摘要

A system on chip (SOC) is provided according to an embodiment of the invention. The SOC includes a storage system, a network on chip (NOC) adapted to communicate with a communication network, and a processing system in communication with the storage system and with the NOC. The processing system is configured to conduct operations of the SOC and perform communication operations using the NOC. The SOC further includes an integrated test processor (ITP) in communication with the processing system, the storage system, and the NOC. The ITP is configured to generate a logical function test instruction for testing one or more logical functions of the SOC and generate a physical link test instruction for testing one or more physical links of the SOC.