发明名称 SURFACE OBSERVATION METHOD USING SCANNING PROBE ATOMIC FORCE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a surface observation method using a scanning probe atomic force microscope capable of observing various differences of the surface state, especially the difference of hydrophobicity or hydrophilicity of the surface. SOLUTION: The object surface is observed by measuring a horizontal force relative to the object whose surface has a part having different hydrophobicity or hydrophilicity by using the scanning probe atomic force microscope having a probe of a cantilever type modified by an organic compound. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007171006(A) 申请公布日期 2007.07.05
申请号 JP20050369496 申请日期 2005.12.22
申请人 MITSUI CHEMICAL ANALYSIS & CONSULTING SERVICE INC 发明人 NAKAHARA SHIGEKI
分类号 G01Q60/26;G01Q60/38;G01Q60/42 主分类号 G01Q60/26
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