发明名称 Treatment systems and methods
摘要 Improved immersion vessel configurations for treatment of precision manufactured devices such as semiconductor wafers are provided. In one aspect, an immersion vessel is provided wherein the sidewalls of the immersion vessel are less than about 10 mm from the major surfaces of the wafer or wafers. In another aspect, an immersion vessel provided with a megasonic transducer has a cleaning zone that is progressively smaller in width from the area proximal to the transducer to the area that is distal from the transducer. In another aspect, an immersion vessel is provided having at least one movable sidewall to provide variable volume capacity of liquid in the vessel. In another aspect, a self-cleaning wafer liquid treatment system is provided having a plurality of cascade chambers.
申请公布号 US2007151576(A1) 申请公布日期 2007.07.05
申请号 US20070650245 申请日期 2007.01.05
申请人 CHRISTENSON KURT K;RATHMAN CHRISTINA 发明人 CHRISTENSON KURT K.;RATHMAN CHRISTINA
分类号 C23G1/00;B08B3/00;B08B3/12 主分类号 C23G1/00
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