| 摘要 |
PROBLEM TO BE SOLVED: To provide a substrate for optical inspection constituted so as to prevent the closure of a flow channel while suppressing an optical adverse effect. SOLUTION: The substrate 1 for optical inspection is used in a method for detecting detection light with a specific wavelength, which is obtained by irradiating the sample in a flow channel 10, by a photodetector 20 with the sample circulated through the flow channel 10 provided in the substrate 1. Fine unevenness parts (protrusions 12) are cyclically provided to the inner wall surface of the flow channel 10 and the cycle of the unevenness parts is 50% or below of the wavelength of the detection light. COPYRIGHT: (C)2007,JPO&INPIT
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