发明名称 Chalcogenide layer etching method
摘要 A protective layer is deposited on a chalcogenide layer and a patterned photoresist layer is formed on the protective layer. The patterned photoresist layer and the protective layer are etched to form openings therethrough to the chalcogenide layer to create etched photoresist and etched protective layers. The etched photoresist layer is removed leaving at least a portion of the etched protective layer. The chalcogenide layer is etched through the openings in the etched protective layer.
申请公布号 US2007154847(A1) 申请公布日期 2007.07.05
申请号 US20060360447 申请日期 2006.02.23
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN CHIEH F.;HO CHIAHUA
分类号 G03F7/26 主分类号 G03F7/26
代理机构 代理人
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