发明名称 Method of forming device having a raised extension region
摘要 A method is disclosed of forming an extension region for a transistor having a gate structure overlying a compound semiconductor layer. An anneal is used either before or after deep source/drain implantation to diffuse a dopant from a raised region adjacent the gate structure to a location underlying the gate structure. A non-diffusing activation process can be used to activate source/drain implants when the dopants from the raised region are diffused prior to deep source/drain implantation.
申请公布号 US2007155073(A1) 申请公布日期 2007.07.05
申请号 US20060324510 申请日期 2006.01.03
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 GOKTEPELI SINAN;FOISY MARK C.
分类号 H01L21/8234 主分类号 H01L21/8234
代理机构 代理人
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