发明名称 METHOD OF MANUFACTURING A CAPACITOR DEEP TRENCH AND OF ETCHING A DEEP TRENCH OPENING
摘要 A substrate is provided having an oxide layer, a first nitride-silicon, a STI, and a second nitride-silicon. A pattern poly-silicon layer on the second nitride-silicon layer is etched to form a deep trench opening. Etching the pattern poly-silicon layer also deepens the deep trench opening. Then, a conductive layer is filled in the deep trench opening.
申请公布号 US2007155089(A1) 申请公布日期 2007.07.05
申请号 US20060306560 申请日期 2006.01.03
申请人 YEH TA-CHUAN;CHUNG NI-MIN;HUANG KAO-SU;LIN YUNG-CHANG;LEE RUEY-CHYR;WANG CHIEN-KUO 发明人 YEH TA-CHUAN;CHUNG NI-MIN;HUANG KAO-SU;LIN YUNG-CHANG;LEE RUEY-CHYR;WANG CHIEN-KUO
分类号 H01L21/8242 主分类号 H01L21/8242
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