发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a high-performance semiconductor device with a simple gettering process at low temperatures, and to provide the semiconductor device and a display unit can be obtained with the use of it. SOLUTION: The method for manufacturing the semiconductor device having a structure with a crystalline semiconductor layer with a catalitic element added, a gate insulating film, and a gate electrode laminated on an insulating substrate in this order includes a light irradiating process for irradiating the light that passes through the crystalline semiconductor layer and is absorbed by the gate electrode to the gate electrode. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007173612(A) 申请公布日期 2007.07.05
申请号 JP20050370665 申请日期 2005.12.22
申请人 SHARP CORP 发明人 YASUMATSU TAKUTO;KIMURA TOMOHIRO
分类号 H01L29/786;H01L21/20;H01L21/336 主分类号 H01L29/786
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