PROBE PIN

摘要

Resistivity increase of a probe pin is suppressed and service life of the probe pin is lengthened, even when the leading end of the probe pin is worn due to repeated contact with objects to be inspected. The probe pin is provided with a multilayer flat plate-like plunger (1) having a center layer (11) and a reinforcing layer (12). The center layer is composed of a substantially strip-shaped flat plate the leading end of which on the side to be brought into contact with the object to be inspected has a wedge shape. The reinforcing layer is formed of a substantially strip-shaped flat plate at least on one side of the both sides of the center layer (11) and reinforces the center layer (11). The probe pin is also provided with a plunger (2) and a coil spring (3).