发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To solve a problem that when a property of a reference side in differential type read determination operation is achieved by a memory cell (reference cell) in a memory apparatus of a virtual ground system, a leak current through a cell being adjacent to the reference cell is dispersed by the process, thereby, stable read becomes hard. <P>SOLUTION: A bit line potential selecting means for applying a write-in potential to the bit line of an electric charges accumulating side and applying a ground potential to the bit line of the other side is provided on a memory cell being adjacent to the reference cell. Since a leak current to the adjacent cell from the reference cell is prevented by performing write-in operation for the adjacent cell using this constitution, the original property of the reference cell can be reflected to read-out operation as the property of the reference side, and stable read can be achieved. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007172747(A) 申请公布日期 2007.07.05
申请号 JP20050369656 申请日期 2005.12.22
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MARUYAMA TAKASHI;KAWAHARA AKIFUMI;KONO KAZUYUKI;TOMITA YASUHIRO
分类号 G11C16/04;G11C16/02;G11C16/06 主分类号 G11C16/04
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