发明名称 OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION DEVICE USED THEREFOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an inspection method using a portable optical inspection apparatus drivable by a battery, and capable of acquiring an accurate sensing result without being influenced by an environmental temperature condition. <P>SOLUTION: When measuring a material quantity included in a sample imparted onto a sensing thin film by a light signal acquired from a sensor chip by irradiating the sensor chip with light as long as a fixed period by using an optical inspection device equipped with the sensor chip having a substrate 5, an optical waveguide layer 6 and the sensing thin film 7 stuck onto the optical waveguide layer surface; a light source 8 for irradiating the sensor chip with light; and a light receiving element 9 for receiving light outputted from the sensor chip and converting it into an electric signal, the light source is flashed in a plurality of times in a fixed period of inspection light irradiation, and the light quantity at the lighting time is measured by the light receiving element, to thereby determine the material quantity. In this case, the light quantity at the light switching-off time is measured, and the material quantity can be determined also from the difference thereof. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007171027(A) 申请公布日期 2007.07.05
申请号 JP20050370298 申请日期 2005.12.22
申请人 TOSHIBA CORP 发明人 TAKASE TOMOHIRO;UEMATSU IKUO;NAWATA ISAO
分类号 G01N21/27;G01N21/552 主分类号 G01N21/27
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