发明名称 INSPECTION METHOD AND APPARATUS USING SCANNING LASER SQUID MICROSCOPE
摘要 A non-destructive method of narrowing down the location of a failure in a sample includes a first step of acquiring first and second images of magnetic-field distributions obtained by scanning a laser beam irradiating first and second samples, respectively, and if there is a difference between the first and second images of the magnetic-field distributions, a second step of acquiring first and second current images from magnetic-field distributions acquired by scanning the first and second samples by a magnetic-field detector in a state in which a prescribed location on the first and second samples is being irradiated by the laser beam. The difference between the first and second current images is found and, based upon the difference image found, it becomes possible to identify a disparity in current paths relating to the prescribed location on the first and second samples.
申请公布号 US2007152664(A1) 申请公布日期 2007.07.05
申请号 US20060374160 申请日期 2006.03.14
申请人 NEC ELECTRONICS CORPORATION 发明人 NIKAWA KIYOSHI
分类号 G01R33/02 主分类号 G01R33/02
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