发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device whereby a photoresist cured in a semiconductor manufacturing step can easily be exfoliated more easily than prior arts without giving an adverse effect on the reliability of the semiconductor device. SOLUTION: The method of manufacturing the semiconductor device includes the steps of: forming a photoresist film 20 on a support substrate 10 or a structure formed on the support substrate 10; applying patterning to the photoresist film; injecting a substance by using the photoresist film for a mask, or applying dry etching processing to the photoresist film; exposing the photoresist film for an organic solvent for swelling or dissolving the photoresist film; and impregnating the photoresist film into a chemical including sulfuric acid to remove the photoresist film. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007173730(A) |
申请公布日期 |
2007.07.05 |
申请号 |
JP20050372655 |
申请日期 |
2005.12.26 |
申请人 |
TOSHIBA CORP |
发明人 |
YAMADA KOREI;MIYAZAKI KUNIHIRO;TOMITA HIROSHI |
分类号 |
H01L21/027;G03F7/42;H01L21/304 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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地址 |
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