发明名称 EDDY CURRENT INSPECTION SYSTEM FOR TESTING COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide an eddy current inspection system, capable of decomposing an original image into a plurality of images, containing each different frequency component and reconfiguring at least one final image of a component containing a frequency component related to the eddy current flaw signal. SOLUTION: The eddy current inspection system includes an eddy current probe 70; and a computer 78 connected to the eddy current probe. The computer generates (102) an original image in the component 52 being tested, decomposes (104) the original image into a plurality of images containing each different frequency component, and reconstitutes (106) at least one final image in the component that includes the frequency component related to the eddy current flaw signal. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007171199(A) 申请公布日期 2007.07.05
申请号 JP20060344596 申请日期 2006.12.21
申请人 GENERAL ELECTRIC CO <GE> 发明人 SUH UI WON;GAMBRELL GIGI O;MCKNIGHT WILLIAM;PISUPATI PREETI
分类号 G01N27/90 主分类号 G01N27/90
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