发明名称 WITHSTAND VOLTAGE TESTER
摘要 PROBLEM TO BE SOLVED: To easily analyze how much test current flows to cause FAIL determination when the FAIL is determined in a withstand voltage test. SOLUTION: A test voltage value, testing time, a threshold Ib of test current used as an acceptance determination reference, and a test stop current value Ic larger than the threshold Ib can be set to a control section 13 from an input section 14. When the test current Ia flowing in a tested object EUT is smaller than the threshold Ib during the test, a first routine of outputting the acceptance determination to a display section 15 is executed after the lapse of the testing time. When the test current Ia is larger than the test stop current value Ic, a second routine of stopping the test at that time and outputting fail determination to the display section 15 is executed. When the test current Ia is larger than the threshold Ib and smaller than the test stop current value Ic, the test is continued until the testing time is finished and a third routine of outputting fail determination to the display section 15 is executed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007171072(A) 申请公布日期 2007.07.05
申请号 JP20050371442 申请日期 2005.12.26
申请人 HIOKI EE CORP;TOKYO SEIDEN KK 发明人 HIGUCHI MASAO;KOYANAGI IZUMI;TATSUNO SHOJI
分类号 G01R31/12;G01R31/02 主分类号 G01R31/12
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