| 摘要 |
A system, apparatus and method for testing and optimizing an electrical device using a simultaneous display of both a signal's eye diagram and total jitter profile are described. In one embodiment of the invention, a data capture module capable of obtaining and separating the total jitter present in a signal into deterministic and random jitter, as well as other eye diagram information, is coupled to the electrical device and one or more display devices. These one or more display devices provide a user a simultaneous visual display of both random jitter and an eye diagram. This simultaneous display allows a user to test and optimize the electrical device without having to attach and detach the electrical device to multiple measuring devices.
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