发明名称 |
System and method for testing one or more dies on a semiconductor wafer |
摘要 |
A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies The testing system includes one or more write registers connected to one or more dies on the semiconductor wafer. One or more comparators are connected to the dies and the write registers. The comparator generates a result in response to the original data and the read data.
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申请公布号 |
US2007152700(A1) |
申请公布日期 |
2007.07.05 |
申请号 |
US20070707408 |
申请日期 |
2007.02.16 |
申请人 |
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发明人 |
MA DAVID S.;WANG TAO;DIETZ JAMES J.;REN BING |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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