| 摘要 |
PROBLEM TO BE SOLVED: To generate a test pattern capable of testing an LSI efficiently. SOLUTION: This method for generating a test pattern 14 used for a test of the LSI including a single via SV and a redundant via RV, has (A) a step for extracting a single via structure SV distinctively from a redundant via structure RV by referring to layout data 12, (B) a step for counting the number of single via structures SV to each of a plurality of nets included in the LSI by referring to a net list 11, and (C) a step for generating the test pattern 14 for testing preferentially a net having more single via structures SV among the plurality of nets. COPYRIGHT: (C)2007,JPO&INPIT
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