发明名称 |
Method for manufacturing a transistor with self-aligned channel |
摘要 |
<p>The present invention relates to a method for manufacturing transistors comprising a control electrode and a self-aligned channel. According to the method of the present invention, the control electrode may be formed by etching a conductive layer (21) in two steps, a first step using a first mask and a second step using a second mask (25). The final pattern of the control electrode is defined by the overlap between the first and second mask (25).</p> |
申请公布号 |
EP1804285(A1) |
申请公布日期 |
2007.07.04 |
申请号 |
EP20050077990 |
申请日期 |
2005.12.27 |
申请人 |
AMI SEMICONDUCTOR BELGIUM BVBA |
发明人 |
HAKIM, HEDI |
分类号 |
H01L21/336;H01L21/265;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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