发明名称 Method for manufacturing a transistor with self-aligned channel
摘要 <p>The present invention relates to a method for manufacturing transistors comprising a control electrode and a self-aligned channel. According to the method of the present invention, the control electrode may be formed by etching a conductive layer (21) in two steps, a first step using a first mask and a second step using a second mask (25). The final pattern of the control electrode is defined by the overlap between the first and second mask (25).</p>
申请公布号 EP1804285(A1) 申请公布日期 2007.07.04
申请号 EP20050077990 申请日期 2005.12.27
申请人 AMI SEMICONDUCTOR BELGIUM BVBA 发明人 HAKIM, HEDI
分类号 H01L21/336;H01L21/265;H01L29/78 主分类号 H01L21/336
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