发明名称 SYSTEM AND METHOD FOR PCB TEST AND FUNCTION TEST USING BOUNDARY SCAN TEST
摘要 A terminal PCB(Printed Circuit Board) checking and function test system using a boundary scan test and a method therefor are provided to process predetermined test data and test function performance commands by using boundary scan test functions equipped in internal chips of each terminal, thereby more quickly and exactly processing terminal function tests. Mobile communication terminals are mounted with at least one chip having boundary scan test functions on internal PCBs. A worker's terminal conducts PCB checking functions by processing test clock, test mode selection, test data, and test function performance commands with the chips having the boundary scan test functions for each terminal, or conducts function tests of the terminal chips, and outputs the PCB checking results. A hub simultaneously connects the terminals which are checking targets with the worker's terminal by using predetermined signals and data cables.
申请公布号 KR20070072030(A) 申请公布日期 2007.07.04
申请号 KR20050135952 申请日期 2005.12.30
申请人 PANTECH CO., LTD. 发明人 LEE, SUN WHA
分类号 H04B17/00 主分类号 H04B17/00
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