发明名称 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 In a fabrication method of a semiconductor device including a plurality of silicon-based transistors or capacitors, there exist hydrogen at least in a part of a silicon surface in advance, and the hydrogen is removed by exposing the silicon surface to a first inert gas plasma. Thereafter, plasma is generated by a mixed gas of a second inert gas and one or more gaseous molecules, and a silicon compound layer containing at least a part of the elements constituting the gaseous molecules is formed on the surface of the silicon gas. <IMAGE>
申请公布号 IL181060(D0) 申请公布日期 2007.07.04
申请号 IL20070181060 申请日期 2007.01.30
申请人 FOUNDATION FOR ADVANCEMENT OF INTERNATIONAL SCIENCE 发明人
分类号 H01L21/28;H01L21/306;H01L21/314;H01L21/316;H01L21/318;H01L21/336;H01L21/76;H01L21/8234;H01L21/8239;H01L21/8246;H01L21/8247;H01L27/00;H01L27/088;H01L27/105;H01L27/115;H01L27/12;H01L29/49;H01L29/51;H01L29/78;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/28
代理机构 代理人
主权项
地址