Pin coupler for an integrated circuit tester

摘要

A coupling unit that couples at least two pins of an ATE (Automated Test Equipment) to a pin of a device under test includes an ATE interface for receiving a plurality of first stimulus signals from selected ATE-pins and/or for sending a plurality of first response signals to the selected ATE-pins, a DUT interface for sending a second stimulus signal to the DUT-pin and/or for receiving a second response signal from the DUT-pin, and a multiplexer circuit for serializing data of the plurality of first stimulus signals into the second stimulus signal and/or a de-multiplexer circuit adapted for parallelizing data of the second response signal into the plurality of first response signals.