发明名称 System and method for providing a uniform oxide layer over a laser trimmed fuse with a differential wet etch stop technique
摘要 A system and method is disclosed for using a differential wet etch stop technique to provide a uniform oxide layer over a metal layer in a laser trimmed fuse. A layer of boron doped oxide with a slow etch rate is placed over the metal layer. A layer of phosphorus doped oxide with a fast etch rate is placed over the boron doped oxide. The time period required for a wet etch process to etch through the phosphorus doped oxide is calculated. The wet etch process is then applied to the phosphorus doped oxide for the calculated time period. The wet etch process slows significantly when it reaches the boron doped oxide. This method forms a uniform layer of boron doped oxide over the metal layer.
申请公布号 US7238620(B1) 申请公布日期 2007.07.03
申请号 US20040781166 申请日期 2004.02.18
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 FOOTE RICHARD W.
分类号 H01L21/302 主分类号 H01L21/302
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