发明名称 APPARATUS FOR MONITERING TRANSPORT OF WAFER IN SEMICONDUCTOR MANUFACTURING UNIT
摘要 An apparatus for monitoring wafer transfer in semiconductor fabricating equipment is provided to monitor a slope level of a blade of a robot when a wafer is transferred to a process chamber. A level detecting sensor is installed on an arm(13) of a robot(11) to detect a slope of a blade(15) supporting the wafer. An allowable slope storing unit(105) stores an allowable slope value to prevent the blade from being collided against a wall of a chamber or other structures even when the blade is inclined. A slope analyzing unit(106) receives the detected level value of the blade, and compares the value with the allowable slope value to alarm collision danger through an alarm portion(107).
申请公布号 KR20070069990(A) 申请公布日期 2007.07.03
申请号 KR20050132769 申请日期 2005.12.28
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 KIM, SANG YUN
分类号 H01L21/67 主分类号 H01L21/67
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