发明名称 |
APPARATUS FOR MONITERING TRANSPORT OF WAFER IN SEMICONDUCTOR MANUFACTURING UNIT |
摘要 |
An apparatus for monitoring wafer transfer in semiconductor fabricating equipment is provided to monitor a slope level of a blade of a robot when a wafer is transferred to a process chamber. A level detecting sensor is installed on an arm(13) of a robot(11) to detect a slope of a blade(15) supporting the wafer. An allowable slope storing unit(105) stores an allowable slope value to prevent the blade from being collided against a wall of a chamber or other structures even when the blade is inclined. A slope analyzing unit(106) receives the detected level value of the blade, and compares the value with the allowable slope value to alarm collision danger through an alarm portion(107).
|
申请公布号 |
KR20070069990(A) |
申请公布日期 |
2007.07.03 |
申请号 |
KR20050132769 |
申请日期 |
2005.12.28 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
KIM, SANG YUN |
分类号 |
H01L21/67 |
主分类号 |
H01L21/67 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|