发明名称 Epitaxial semiconductor deposition methods and structures
摘要 Methods for depositing epitaxial films such as epitaxial Ge and SiGe films. During cooling from high temperature processing to lower deposition temperatures for Ge-containing layers, Si or Ge compounds are provided to the substrate. Smooth, thin, relatively defect-free Ge or SiGe layers result. Retrograded relaxed SiGe is also provided between a relaxed, high Ge-content seed layer and an overlying strained layer.
申请公布号 US7238595(B2) 申请公布日期 2007.07.03
申请号 US20040800390 申请日期 2004.03.12
申请人 发明人
分类号 H01L21/20;C30B1/00;C30B23/00;C30B25/00;C30B25/02;C30B28/12;C30B28/14;C30B29/52;H01L21/205;H01L21/36 主分类号 H01L21/20
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