发明名称 METHOD FOR MANUFACTURING PROBE STRUCTURE
摘要 A method for manufacturing a probe structure is provided to perform easily a wet etching process and to reduce processing costs by forming the probe structure using two semiconductor substrates with different crystalline orientations. A first semiconductor substrate(100) with a first crystalline orientation is bonded to a second semiconductor substrate(110) with a second crystalline orientation. A probe tip region is formed by etching selectively the first and second semiconductor substrates. A probe beam region is formed by etching the second semiconductor substrate. A probe structure(180) composed of the probe tip and the probe beam is formed on the resultant structure by filling the probe tip region and the probe beam region.
申请公布号 KR100736678(B1) 申请公布日期 2007.07.02
申请号 KR20060073790 申请日期 2006.08.04
申请人 UNITEST INC. 发明人 KIM, BONG HWAN;PARK, BUM JIN;KIM, JONG BOK;LEE, CHI WOO
分类号 H01L21/66 主分类号 H01L21/66
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