发明名称 |
METHOD FOR MANUFACTURING PROBE STRUCTURE |
摘要 |
A method for manufacturing a probe structure is provided to perform easily a wet etching process and to reduce processing costs by forming the probe structure using two semiconductor substrates with different crystalline orientations. A first semiconductor substrate(100) with a first crystalline orientation is bonded to a second semiconductor substrate(110) with a second crystalline orientation. A probe tip region is formed by etching selectively the first and second semiconductor substrates. A probe beam region is formed by etching the second semiconductor substrate. A probe structure(180) composed of the probe tip and the probe beam is formed on the resultant structure by filling the probe tip region and the probe beam region.
|
申请公布号 |
KR100736678(B1) |
申请公布日期 |
2007.07.02 |
申请号 |
KR20060073790 |
申请日期 |
2006.08.04 |
申请人 |
UNITEST INC. |
发明人 |
KIM, BONG HWAN;PARK, BUM JIN;KIM, JONG BOK;LEE, CHI WOO |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|