发明名称 PLASMA PROCESSING EQUIPMENT AND PROCESS FOR PERFORMING SHALLOW TRENCH ISOLATION USING THE SAME
摘要 Plasma processing equipment and a method for forming an isolation film using the same are provided to perform inductively coupled plasma and chemical dry etch in one process chamber. An electrostatic chuck(120) is located in a process chamber(110), and is connected to a bias power(125). An induced coil antenna(130) is positioned on an external upper portion of the process chamber, and is connected to a high-frequency power(135). A process gas supply unit(150) is connected to the process chamber, and supplies a process gas into the process chamber to form a trench on a substrate. A nozzle part(200) supplies plasma into the process chamber to round a lower corner of the trench.
申请公布号 KR20070069975(A) 申请公布日期 2007.07.03
申请号 KR20050132740 申请日期 2005.12.28
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 HONG, JEONG PYO
分类号 H01L21/3065;H01L21/02;H01L21/76 主分类号 H01L21/3065
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