发明名称 |
PLASMA PROCESSING EQUIPMENT AND PROCESS FOR PERFORMING SHALLOW TRENCH ISOLATION USING THE SAME |
摘要 |
Plasma processing equipment and a method for forming an isolation film using the same are provided to perform inductively coupled plasma and chemical dry etch in one process chamber. An electrostatic chuck(120) is located in a process chamber(110), and is connected to a bias power(125). An induced coil antenna(130) is positioned on an external upper portion of the process chamber, and is connected to a high-frequency power(135). A process gas supply unit(150) is connected to the process chamber, and supplies a process gas into the process chamber to form a trench on a substrate. A nozzle part(200) supplies plasma into the process chamber to round a lower corner of the trench.
|
申请公布号 |
KR20070069975(A) |
申请公布日期 |
2007.07.03 |
申请号 |
KR20050132740 |
申请日期 |
2005.12.28 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
HONG, JEONG PYO |
分类号 |
H01L21/3065;H01L21/02;H01L21/76 |
主分类号 |
H01L21/3065 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|