发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE AND ELECTRONIC APPRATUS THEREFORE
摘要 <p>A method for manufacturing a semiconductor device, a semiconductor device and an electronic apparatus therefor are provided to manufacture a MOSFET having a gate all around structure with a relatively simple method. A lower gate electrode is formed on a substrate(12), and a sacrificial layer is formed on the substrate to cover the lower gate electrode. A semiconductor layer(18) is formed on the sacrificial layer to cross the semiconductor layer, and then the sacrificial layer is removed. A lower gate insulating layer(22a) is formed in an empty space between the lower gate electrode and the semiconductor film. An upper gate insulating layer(22b) is formed on the semiconductor layer. An upper gate electrode(14b) is formed on the upper gate insulating layer.</p>
申请公布号 KR20070069057(A) 申请公布日期 2007.07.02
申请号 KR20060133883 申请日期 2006.12.26
申请人 SEIKO EPSON CORPORATION 发明人 YUDASAKA ICHIO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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