发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method for fabricating a semiconductor device is provided to prevent warpage of a first wafer by attaching a second wafer to the back surface of a first wafer and by growing a silicon epitaxial layer on the front surface of the first wafer. An oxide layer(110) can be formed on the back surface of a first wafer(100). To the back surface of the first wafer doped with impurities of first density, a second wafer doped with impurities of second density lower than the first density is attached. A silicon epitaxial layer(140) is grown on the front surface of the first wafer by using the second wafer as a diffusion preventing layer for preventing the impurities doped into the first wafer from being diffused.
申请公布号 KR20070068013(A) 申请公布日期 2007.06.29
申请号 KR20050129637 申请日期 2005.12.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, YUN DEOK;KANG, DONG MIN;KIM, GI JUNG;KIM, YOUNG NAM;BAE, JAE SIK;KIM, KI HYEON;CHOI, KYOUNG JIN;LEE, JI SUNG;LIM, YOUNG SAM
分类号 H01L27/146;H01L21/20 主分类号 H01L27/146
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