发明名称 METHOD AND APPARATUS FOR MEASURING HEIGHT OF SUBSTRATE SPACE ADJUSTING SPACER OF LIQUID CRYSTAL PANEL
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring the height of a substrate space adjusting spacer of a liquid crystal panel, which can accurately measure the height of the substrate space adjusting spacer over a comparatively wide range, without regard to the shape of the spacer. SOLUTION: The liquid crystal panel has the space adjusting spacer interposed between a pair of substrates and enclosing a liquid crystal in between both the substrates. In this state where the space adjusting spacer 21 is disposed on one surface side of one substrate 11, a measuring transparent plate 14 is mounted on the spacer 21, and the measuring transparent plate 14 is depressed so as to be brought into contact with the spacer 21. The clearance between the mounting surface of the measuring transparent plate 14 and the surface of the substrate 11 is measured by utilizing an optical means 12, thereby obtaining the height of the spacer 21 on the surface of the substrate 11. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007163296(A) 申请公布日期 2007.06.28
申请号 JP20050360054 申请日期 2005.12.14
申请人 TAKANO CO LTD 发明人 SAITO YASUSHI
分类号 G01B11/14;G02F1/1339 主分类号 G01B11/14
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