发明名称 CHEMICAL MECHANICAL POLISHING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polishing method which can inhibit the dishing in a small amount of use of a polishing liquid and can carry out an LSI processing of high performance when chemically and mechanically polishing a workpiece in a semiconductor device manufacturing process. <P>SOLUTION: The method, which chemically and mechanically flattens a conductive material film in a semiconductor device manufacturing method, polishes the film, making a polishing pad contact with a polishing surface of a body to be polished and making a relative motion, while supplying a metal polishing liquid, which has at least one carboxyl group in a molecule, and preferably contains an organic acid not belonged to an amino acid, however, do not contain any polishing particle, and is of 2-6 pH, in a polishing liquid flow of 0.035-0.25 ml/(min cm<SP>2</SP>). <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007165784(A) 申请公布日期 2007.06.28
申请号 JP20050363580 申请日期 2005.12.16
申请人 FUJIFILM CORP 发明人 KAMIMURA TETSUYA
分类号 H01L21/304;B24B37/00 主分类号 H01L21/304
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