发明名称 Conformal electroless deposition of barrier layer materials
摘要 Methods of fabricating interconnect structures utilizing barrier material layers formed with an electroless deposition technique utilizing a coupling agent complexed with a catalytic metal and structures formed thereby. The fabrication fundamentally comprises providing a dielectric material layer having an opening extending into the dielectric material from a first surface thereof, bonding the coupling agent to the dielectric material within the opening, and electrolessly depositing the barrier material layer, wherein the electrolessly deposited barrier material layer material adheres to the catalytic metal of the coupling agent.
申请公布号 US2007148952(A1) 申请公布日期 2007.06.28
申请号 US20050318137 申请日期 2005.12.23
申请人 发明人 O'BRIEN KEVIN P.;CHENG CHIN-CHANG;CHEBIAM RAMANAN V.;DUBIN VALERY M.;BALAKRISHNAN SRIDHAR
分类号 H01L21/4763 主分类号 H01L21/4763
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