PROCESS FOR DETERMINING LOCAL EMISSIVITY PROFILE OF SUPRATHERMAL ELECTRONS
摘要
The invention concerns a process for determining a local emissivity profile of suprathermal electrons coming from an ionized gas ring placed in a toric vessel, with the use of tomographic inversion by means of Bessel functions Jo of order 0 which exploits line-integrated measurements acquired by current real-time Hard-X-Ray diagnostics.
申请公布号
WO2006067083(A9)
申请公布日期
2007.06.28
申请号
WO2005EP56829
申请日期
2005.12.15
申请人
COMMISSARIAT A L'ENERGIE ATOMIQUE;MAZON, DIDIER;BARANA, OLIVEIRO;PEYSSON, YVES