发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To further suppress gate leakage current. SOLUTION: A semiconductor device comprises a semiconductor substrate, a channel region formed on the surface of the semiconductor substrate, source and drain regions respectively formed on both sides of the channel region of the semiconductor region, a gate insulating film so formed as to cover the channel region, and a gate electrode formed on the insulating film, wherein the gate insulating film is formed by a super-lattice single-crystal insulator film. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007165918(A) 申请公布日期 2007.06.28
申请号 JP20070005800 申请日期 2007.01.15
申请人 TOSHIBA CORP 发明人 CHO AKIMI;SATAKE HIDEKI
分类号 H01L29/78;C23C14/08;C23C16/40;H01L21/316 主分类号 H01L29/78
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