发明名称 Method and composition for plasma etching of a self-aligned contact opening
摘要 A method of forming a self-aligned contact opening in an insulative layer formed over a substrate in a semiconductor device involves etching the insulative layer with at least one fluorocarbon and ammonia.
申请公布号 US2007148965(A1) 申请公布日期 2007.06.28
申请号 US20070698158 申请日期 2007.01.26
申请人 发明人 TRAPP SHANE J.
分类号 H01L21/465 主分类号 H01L21/465
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