发明名称 SYNCHRONOUS SEMICONDUCTOR MEMORY DEVICE
摘要 Provided is a synchronous semiconductor memory device with improved latency control. In one embodiment, the synchronous semiconductor memory device may include a clock synchronizing circuit, a latency circuit, and a latency control circuit. The clock synchronizing circuit may receive an external clock signal and output a data output clock signal. The latency circuit may store a read signal in response to at least one sampling clock signal, generate a plurality of clock control signals in a sequential manner, generate a plurality of transfer clock signals synchronized with the plurality of clock control signals, and supply a latency signal in response to the transfer clock signals. The latency control circuit may delay the plurality of clock control signals by the sum of output delay time and the read command delay time so as to generate a plurality of sampling clock signals synchronized with the plurality of delayed clock control signals.
申请公布号 US2007147167(A1) 申请公布日期 2007.06.28
申请号 US20060609865 申请日期 2006.12.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHU YONG-GYU
分类号 G11C8/00 主分类号 G11C8/00
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