发明名称 METHOD FOR FORMING COMPRESSIVE CHANNEL LAYER OF PMOS DEVICE USING GATE SPACER, AND PMOS DEVICE MANUFACTURED BY SAME
摘要 <P>PROBLEM TO BE SOLVED: To form a compressive channel layer in a PMOS device by simple processes and at a low price. <P>SOLUTION: The method is provided for forming a compressive channel layer in a PMOS device and a PMOS device formed by the method. The method includes steps of (a) forming a buffer oxide layer on a silicon semiconductor substrate having a gate oxide layer and a gate electrode thereon, (b) forming a silicon nitride layer on the buffer oxide layer, (c) ion-implanting impurities into the silicon nitride layer, and (d) patterning the silicon nitride layer and the buffer oxide layer into which impurities are implanted to form gate spacers on both sidewalls of the gate electrode. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007165891(A) 申请公布日期 2007.06.28
申请号 JP20060333029 申请日期 2006.12.11
申请人 DONGBU ELECTRONICS CO LTD 发明人 PARK JIN HA
分类号 H01L29/78 主分类号 H01L29/78
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