VOLTAGE MEASURING METHOD, ELECTRICAL TEST METHOD AND APPARATUS, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND DEVICE SUBSTRATE MANUFACTURING METHOD

摘要

PURPOSE: A method for measuring a voltage is provided to prevent productivity from being decreased by fine dust generated in using a probe in a subsequent process by determining the state of a pixel while not directly using the probe in an interconnection or a probe terminal. CONSTITUTION: The first alternating current(AC) voltage is applied to a gap between two terminals of the first coil. The first and second coils overlap each other, having a uniform interval therebetween. The third AC voltage is applied to a pixel electrode of the pixel by using the second AC voltage generated between two terminals of the second coil. The pixel electrode and a test electrode overlap each other, having a uniform interval therebetween. A voltage applied from the fourth AC voltage generated in the test electrode to the pixel electrode is calculated.