| 摘要 |
PROBLEM TO BE SOLVED: To enable simplification and a low cost of a burn-in test by simply generating a burn-in test signal to an analog circuit. SOLUTION: A burn-in test signal generation circuit for an analog circuit 2 in LSI is provided with a burn-in test signal route 7 in parallel to a normal signal route 6 to the analog circuit 2, provided with a signal waveform conversion circuit 8 for converting the burn-in test signal of a digital waveform into the burn-in test signal of an analog waveform in the burn-in test signal route 7, and controls to be changed to the burn-in test signal route 7 when performing the burn-in test of the analog circuit 2. COPYRIGHT: (C)2007,JPO&INPIT
|
