发明名称 EQUIPMENT FOR EXPOSING SEMICONDUCTOR DEVICE
摘要 Exposure equipment for manufacturing a semiconductor is provided to prevent local generation of a particle on a reticle and repeated exposure defect due to a foreign substance of the reticle by using a foreign removing unit. A light source(110) generates light for sensitizing a photoresist liquid formed on a wafer(100). A wafer stage(102) supports the wafer where the light generated in the light source is incident. A reticle(160) is formed between the wafer stage and the light source. The reticle transfers a pattern image to the wafer by using the light irradiated from the light source. A reticle stage supports an edge of the reticle. A foreign substance removing unit is formed to be adjacent to the reticle stage and removes a foreign substance caused in the reticle.
申请公布号 KR20070067292(A) 申请公布日期 2007.06.28
申请号 KR20050128416 申请日期 2005.12.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEONG, SIL KEUN
分类号 H01L21/027 主分类号 H01L21/027
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