发明名称 |
EQUIPMENT FOR EXPOSING SEMICONDUCTOR DEVICE |
摘要 |
Exposure equipment for manufacturing a semiconductor is provided to prevent local generation of a particle on a reticle and repeated exposure defect due to a foreign substance of the reticle by using a foreign removing unit. A light source(110) generates light for sensitizing a photoresist liquid formed on a wafer(100). A wafer stage(102) supports the wafer where the light generated in the light source is incident. A reticle(160) is formed between the wafer stage and the light source. The reticle transfers a pattern image to the wafer by using the light irradiated from the light source. A reticle stage supports an edge of the reticle. A foreign substance removing unit is formed to be adjacent to the reticle stage and removes a foreign substance caused in the reticle.
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申请公布号 |
KR20070067292(A) |
申请公布日期 |
2007.06.28 |
申请号 |
KR20050128416 |
申请日期 |
2005.12.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEONG, SIL KEUN |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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