发明名称 METHOD OF CONTROLLING INTERNAL STRESS IN POLYCRYSTALLINE SILICON-GERMANIUM LAYER LAMINATED ON SUBSTRATE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method of controlling internal stress in a polycrystalline silicon-germanium layer laminated on a substrate. <P>SOLUTION: The method of controlling internal stress in a polycrystalline silicon-germanium layer laminated on a substrate includes a step of selecting a range of internal stress in the silicon-germanium layer, a step of selecting evaporation pressure, and a step of evaporation temperature; and at least one of evaporation pressure and evaporation temperature is selected so that internal stress in the silicon-germanium layer becomes within the selected range. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007165927(A) 申请公布日期 2007.06.28
申请号 JP20070029141 申请日期 2007.02.08
申请人 INTERUNIV MICRO ELECTRONICA CENTRUM VZW 发明人 FIORINI PAOLO;SEDKY SHERIF;CAYMAX MATTY;BAERT CHRISTIAAN
分类号 G01J1/02;H01L37/00;B81B3/00;B81C1/00;G01J5/20;H01L21/205;H01L31/0248;H01L31/09;H01L31/18 主分类号 G01J1/02
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