发明名称 |
METHOD OF CONTROLLING INTERNAL STRESS IN POLYCRYSTALLINE SILICON-GERMANIUM LAYER LAMINATED ON SUBSTRATE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of controlling internal stress in a polycrystalline silicon-germanium layer laminated on a substrate. <P>SOLUTION: The method of controlling internal stress in a polycrystalline silicon-germanium layer laminated on a substrate includes a step of selecting a range of internal stress in the silicon-germanium layer, a step of selecting evaporation pressure, and a step of evaporation temperature; and at least one of evaporation pressure and evaporation temperature is selected so that internal stress in the silicon-germanium layer becomes within the selected range. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2007165927(A) |
申请公布日期 |
2007.06.28 |
申请号 |
JP20070029141 |
申请日期 |
2007.02.08 |
申请人 |
INTERUNIV MICRO ELECTRONICA CENTRUM VZW |
发明人 |
FIORINI PAOLO;SEDKY SHERIF;CAYMAX MATTY;BAERT CHRISTIAAN |
分类号 |
G01J1/02;H01L37/00;B81B3/00;B81C1/00;G01J5/20;H01L21/205;H01L31/0248;H01L31/09;H01L31/18 |
主分类号 |
G01J1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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