发明名称 X-RAY FLUOROSCOPIC INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray fluoroscopic inspection apparatus of a variable viewing angle, small in fluctuation of image lightness while keeping an inspection magnification ratio with a simple mechanism and control. SOLUTION: The X-ray fluoroscopic inspection apparatus comprises: a table moving means 14 for adjusting the distance between the X-ray source and the inspection subject table 13, so that the inspection region is approximately positioned on the optical axis of an X-ray, and the inspection magnification ratio is set; a detector moving means 15 for linearly moving an X-ray detector in the X-ray irradiation region in a tilted direction to the subject table for position setting; and a mechanism control mean 16 for making control the table movement means 14 for making detect the fluoroscopic image in the direction tilted to the normal line of the table in the inspection region by a tilt angleαwhile controlling detector moving means 15 for positioning the X-ray detector to the fixed X-ray source and positioning the subject table so as to set the inspection region positions approximately on the optical axis of the X-ray. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007163375(A) 申请公布日期 2007.06.28
申请号 JP20050362168 申请日期 2005.12.15
申请人 TOSHIBA IT & CONTROL SYSTEMS CORP 发明人 FUJII MASAJI;UYAMA KIICHIRO;TSURU SHOJI
分类号 G01N23/04 主分类号 G01N23/04
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