发明名称 Testing memory integrated circuits
摘要 A memory device may include a controller and a plurality of flash memory dice. The controller is provided for read and write access and communications with a host. However, the controller may also be utilized to test one or more of the flash memory dice mounted on the device. In this way, testing may be achieved with a relatively modestly priced tester by making use of the capabilities of the onboard controller. As a result, the cost of a memory device may be reduced in some cases.
申请公布号 US2007145363(A1) 申请公布日期 2007.06.28
申请号 US20050318106 申请日期 2005.12.23
申请人 FANDRICH MICKEY L 发明人 FANDRICH MICKEY L.
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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